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Scanning probe microscope
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281	PDF Document Add to Reading List Source URL: media.wiley.com Language: English - Date: 2013-10-17 07:17:58 Chemistry Atomic force microscopy AFM probe Cantilever Microscopy Near-field scanning optical microscope Scanning tunneling microscope Characterization Microscope Scanning probe microscopy Science Scientific method
282	Curriculum Vitae Name: JUNG Thomas Nationality: Swiss Gender: Male Add to Reading List Source URL: ec.europa.eu Language: English - Date: 2013-10-09 09:47:23 Microbiology Nanotechnology Scanning tunneling microscope Microscopy Microscope Paul Scherrer Atomic force microscopy Christoph Gerber Nanometrology Scanning probe microscopy Science Scientific method
283	Networking of research on modern physics with corporations in the field of nanotechnology Quantum Physics The physics of the very small with great applications Add to Reading List Source URL: files.eun.org Language: English - Date: 2014-07-08 11:23:13 Microscopes Nobel laureates in Physics Scanning tunneling microscope Nanotechnology Quantum tunnelling Electron Heinrich Rohrer Piezoelectricity Gerd Binnig Physics Science Scanning probe microscopy
284	Measurements & Characterization • National Center for Photovoltaics Analytical Microscopy We combine two complementary areas of analytical microscopy— electron microscopy and proximal-probe techniques—and use a va Add to Reading List Source URL: www.nrel.gov Language: English - Date: 2010-09-16 17:44:37 Microscopes Electron microscopy Scanning probe microscopy Electron beam Scanning electron microscope Electron microscope Scanning transmission electron microscopy Characterization Transmission electron microscopy Scientific method Science Microscopy
285	Range-Freq_Plot_Full_b.eps Add to Reading List Source URL: www.kam.k.leang.com Language: English - Date: 2012-12-11 04:21:12 Science Intermolecular forces Atomic force microscopy Piezoelectricity Bending Microscope Physics Materials science Scanning probe microscopy
286	APPLIED SCIENCE / TECHNIQUES PUBLISHED BY THE ADVANCED LIGHT SOURCE COMMUNICATIONS GROUP New ALS Technique Gives Nanoscale Views of Complex Systems Studying and identifying Add to Reading List Source URL: www-als.lbl.gov Language: English Spectroscopy Scanning probe microscopy Microscopy Infrared spectroscopy Near-field scanning optical microscope Fourier transform infrared spectroscopy Infrared Microscope Optical microscope Electromagnetic radiation Chemistry Science
287	15-Advanced_Ultra_Low_Temp.pdf Add to Reading List Source URL: www.nist.gov Language: English - Date: 2013-01-18 17:08:56 Microscope Microbiology Ultra-high vacuum Electron microscopy Microscopy Canton of Neuchâtel Scanning probe microscopy Science Scientific method
288	j623 Index a acrylic acid – photopolymerization 282 Add to Reading List Source URL: www.wiley-vch.de Language: English - Date: 2011-09-05 21:04:13 Materials science Atomic force microscopy Conductive atomic force microscopy Local oxidation nanolithography Force spectroscopy Magnetic force microscope Chemical force microscopy Microscopy Kelvin probe force microscope Scanning probe microscopy Chemistry Science
289	sis_18_RZ_.qxq:Layout[removed]:18 Uhr Add to Reading List Source URL: www.scienceinschool.org Language: English - Date: 2011-04-07 12:39:06 Chemistry Microscopy Intermolecular forces Nanotechnology Spectroscopy Atomic force microscopy Microscope Dip-pen nanolithography Single-molecule experiment Science Scanning probe microscopy Scientific method
290	VII Contents Preface XV Part One Microscopy Fundamentals Add to Reading List Source URL: www.wiley-vch.de Language: English - Date: 2011-09-05 21:04:12 Nanotechnology Atomic force microscopy Near-field scanning optical microscope Microscopy Scanning thermal microscopy Local oxidation nanolithography Polymeric surfaces Chemical force microscopy Magnetic force microscope Scanning probe microscopy Chemistry Science

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